Dr. Alain C. Diebold

Alain Diebold is Professor Emeritus and Empire Innovation Professor of Nanoscale Science in the College of Nanotechnology, Science and Engineering at the University at Albany, SUNY. Professor Diebold maintains an active, funded research program in the materials science of 2D materials and in the characterization and metrology of new semiconductor materials and structures. He is an AVS Fellow and a SPIE Fellow. Significant publications include a Fall 2021 book from Springer Nature entitled the Optical and Electrical Properties of Nanoscale Materials (co-author) and the Handbook of Silicon Semiconductor Metrology (editor and chapter author). Through collaboration with the industrial partners such TEL Technology Center America and Onto Innovations, students and post-doctoral fellows have advanced the characterization and metrology of advanced materials and structures through microscopy, optical, and both laboratory and synchrotron-based X-Ray methods. He authored or co-authored 18 book chapters, nearly 100 peer reviewed journal papers, more than 135 conference proceedings, and given more than 105 invited presentations both domestically and internationally. He remains active in the internal spectroscopic ellipsometry community which provides intellectual inspiration, and more importantly, is the community having many life-long friends.